Recently, thanks to the miniaturization and high performance of commercial-off-the-shelf\n(COTS) computer systems, small satellites get popular. However, due to the very expensive launching\ncost, it is critical to reduce the physical size and weight of the satellite systems such as cube satellites\n(CubeSats), making it infeasible to install high capacity batteries or solar panels. Thus, the low-power\ndesign is one of the most critical issues in the design of such systems. In addition, as satellites\nmake a periodic revolution around the Earth in a vacuum, their operating temperature varies greatly.\nFor instance, in a low earth orbit (LEO) CubeSats, the temperatures vary from 30 to -30 degrees\nCelsius, resulting in a big thermal cycle (TC) in the electronic parts that is known to be one of the\nmost critical reliability threats. Moreover, such LEO CubeSats are not fully protected by active\nthermal control and thermal insulation due to the cost, volume, and weight problems. In this\npaper, we propose to utilize temperature sensors to maximize the lifetime reliability of the LEO\nsatellite systems via multi-core mapping and dynamic voltage and frequency scaling (DVFS) under\npower constraint. As conventional reliability enhancement techniques primarily focus on reducing\nthe temperature, it may cause enlarged TCs, making them even less reliable. On the contrary,\nwe try to maintain the TC optimal in terms of reliability with respect to the given power constraint.\nExperimental evaluation shows that the proposed technique improves the expected lifetime of the\nsatellite embedded systems by up to 8.03 times in the simulation of Nvidiaâ??s Jetson TK1.
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